COMPEL Omeka Dev

Test Pattern

Item

Title

Test Pattern

Creator

Will Huff

Date

2014

Instrumentation

Max/MSP

Duration

variable

Representative Recording(s)

Citation

Will Huff, “Test Pattern,” COMPEL Omeka Dev, accessed November 21, 2024, https://compel-dev.vtlibraries.net/items/show/17.

Comments

Allowed tags: <p>, <a>, <em>, <strong>, <ul>, <ol>, <li>

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